Manufacturing Process Control - MIT OpenCourseWare

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2.830J / 6.780J / ESD.63J Control of Manufacturing Processes (SMA 6303)

Spring 2008

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Control of Manufacturing Processes

Subject 2.830/6.780/ESD.63 Spring 2008 Lecture #10

Yield Modeling

March 11, 2008

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References

? G. May and C. Spanos, Fundamentals of Semiconductor Manufacturing and Process Control, Chapter 5: Yield Modeling (Wiley 2006).

? D. J. Ciplickas, X. Li, and A. J. Strojwas, "Predictive Yield Modeling of VLSIC's," International Workshop on Statistical Metrology, June 2000.

? C. H. Stapper and R. J. Rosner, "Integrated Circuit Yield Management and Yield Analysis: Development and Implementation," IEEE Trans. on Semicond. Manuf., Vol. 8, No. 2, May 1995.

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Types of Yield-Related Problems

? Parametric failures

? deviations in control (e.g. line width) result in functional failures or quality-loss performance degradation

? Random failures

? uncorrelated random failure in some element ? example: individual via failures

? Area dependent failures

? failures related to the area of opportunity for failure ? example: "killer defect" particles

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An Integrated Circuit (IC) Yield Tree

Image removed due to copyright restrictions. Please see Fig. 1 in Ciplickas, Dennis J., et al. "Predictive Yield Modeling of VLSIC's." IEEE 5th International Workshop on Statistical Metrology (2000): 28-37.

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