Yield Modeling and Analysis Prof. Robert C. Leachman IEOR ...
Yield Modeling and Analysis . Prof. Robert C. Leachman . IEOR 130, Methods of Manufacturing Improvement . Spring, 2017 . 1. Introduction . Yield losses from wafer fabrication take two forms: line yield and die yield. Line yield losses result from physical damage of the wafers due to mishandling, or by mis- ................
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